An efficient method for parametric yield optimization of MOS integrated circuits.
Tat-Kwan YuSung-Mo KangJerome SacksWilliam J. WelchPublished in: ICCAD (1989)
Keyphrases
- optimization algorithm
- integrated circuit
- high precision
- detection method
- global optimization
- significant improvement
- constrained optimization
- experimental evaluation
- high accuracy
- optimization method
- computational cost
- dynamic programming
- optimization process
- cost function
- preprocessing
- classification method
- objective function
- genetic algorithm
- optimization model
- data sets
- combinatorial optimization
- clustering method
- support vector machine svm
- input data
- feature set
- prior knowledge