A carrier-mobility model for high-k gate-dielectric Ge MOSFETs with metal gate electrode.

J. P. Xu X. Xiao P. T. Lai

Published in: Microelectron. Reliab. (2010)

Keyphrases

probabilistic model
experimental data
computational model
wide range
high level
mathematical model
neural network
prior knowledge
cost function
management system
theoretical analysis
multi layer