Login / Signup

A methodology for testability enhancement at layout level.

João Paulo TeixeiraIsabel C. TeixeiraC. F. Beltrá AlmeidaFernando M. GonçalvesJ. Gonçalves
Published in: J. Electron. Test. (1991)
Keyphrases
  • higher level
  • high level
  • lower level
  • levels of abstraction
  • real time
  • neural network
  • genetic algorithm
  • bayesian networks
  • multiscale
  • keywords
  • information technology
  • color images
  • probabilistic model