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A new release control policy (WRELM) for semiconductor wafer fabrication facilities.

Zhongbo B. ChenXingwei W. PanLi LiQijun ChenWeisheng S. Xu
Published in: ICNSC (2014)
Keyphrases
  • wafer fabrication
  • control policy
  • long run
  • reinforcement learning
  • approximate dynamic programming
  • admission control
  • dispatching rule
  • control policies
  • facility location
  • batch mode
  • average cost