A model for friction in atomic force microscopy.
Srinivasa M. SalapakaMohammed DahlehPublished in: ACC (2000)
Keyphrases
- computational model
- network model
- decision trees
- image segmentation
- objective function
- expert systems
- prior knowledge
- data sets
- theoretical analysis
- closed form
- statistical model
- management system
- hybrid model
- parameter values
- simulation model
- bayesian framework
- parameter estimation
- probability distribution
- control system
- computer vision
- learning algorithm
- genetic algorithm