Login / Signup

High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis.

Mengshuo WangChanghao YanXin LiDian ZhouXuan Zeng
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2017)
Keyphrases
  • importance sampling
  • high dimensional
  • particle filter
  • genetic algorithm
  • evolutionary algorithm
  • monte carlo