Resolution enhancement in scanning electron microscopy using deep learning.
Kevin de HaanZachary S. BallardYair RivensonYichen WuAydogan OzcanPublished in: CoRR (2019)
Keyphrases
- deep learning
- electron microscopy
- resolution enhancement
- super resolution
- x ray
- unsupervised learning
- visual analysis
- low resolution
- machine learning
- image resolution
- mental models
- thin film
- structured light
- weakly supervised
- multiscale
- higher resolution
- high quality
- discontinuity preserving
- supervised learning
- image processing
- computer vision