Model-based clustering for integrated circuit yield enhancement.
Jung Yoon HwangWay KuoPublished in: Eur. J. Oper. Res. (2007)
Keyphrases
- integrated circuit
- model based clustering
- hierarchical clustering
- em algorithm
- expectation maximization
- agglomerative hierarchical clustering
- mixture model
- vector space model
- image enhancement
- clustering algorithm
- bayesian information criterion
- k means
- document clustering
- electron beam
- image processing
- metadata
- low cost
- objective function