Login / Signup

Defect classification for mechatronic products.

Jan C. AurichNico WolfAndreas GrzegorskiChristian WagenknechtJürgen Münch
Published in: Prod. Eng. (2008)
Keyphrases
  • defect classification
  • case study
  • high tech
  • data mining
  • information retrieval
  • hidden markov models