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A Signal-Integrity Self-Test Concept for Debugging Nanometer CMOS ICs.
Violeta Petrescu
Marcel J. M. Pelgrom
Harry Veendrick
Praveen Pavithran
Jean Wieling
Published in:
ISSCC (2006)
Keyphrases
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high speed
signal processing
software testing
non stationary
high frequency
test data
power consumption
low power
compressive sensing
java programs