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Model-based Reconstruction for Single Particle Cryo-Electron Microscopy.

S. V. VenkatakrishnanPuneet JunejaHugh O'Neill
Published in: ACSSC (2020)
Keyphrases
  • electron microscopy
  • x ray
  • low energy
  • image stacks
  • thin film
  • microscopy images
  • three dimensional
  • image reconstruction
  • genetic algorithm
  • discrete tomography
  • fully automated