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An ADC Test Technique With Dual-Path/Multi-Functional Fine Pattern Generator Realizing High Accuracy Measurement for CMOS Image Sensor.

Fukashi MorishitaMasanori OtsukaWataru Saito
Published in: ATS (2020)
Keyphrases
  • pattern generator
  • high accuracy
  • cmos image sensor
  • dynamic range
  • single chip
  • computer vision
  • multi modal
  • real time
  • image analysis
  • solid state