A Metric-Guided Method for Discovering Impactful Features and Architectural Insights for Skylake-Based Processors.
Ahmad YasinJawad Haj-YahyaYosi Ben-AsherAvi MendelsonPublished in: ACM Trans. Archit. Code Optim. (2020)
Keyphrases
- classification method
- feature set
- clustering method
- high precision
- classification accuracy
- high accuracy
- pairwise
- prior knowledge
- significant improvement
- dynamic programming
- support vector machine
- classification process
- distance function
- detection method
- distance measure
- co occurrence
- image features
- low level
- segmentation method
- cost function
- computational complexity
- test images
- principal components
- geometric constraints
- feature representation
- parallel computing
- data sets