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A Fast Fabric Defect Detection Framework for Multi-Layer Convolutional Neural Network Based on Histogram Back-Projection.

Guodong SunZhen ZhouYuan GaoYun XuLiang XuSong Lin
Published in: IEICE Trans. Inf. Syst. (2019)
Keyphrases
  • multi layer
  • neural network
  • back projection
  • machine learning
  • computational complexity
  • data analysis
  • multiple layers