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Fabrication and Characterization of a Quantum Voltage Noise Source Chip for a Johnson Noise Thermometer.

Yuan ZhongKunli ZhouJinjin LiJifeng QuWenhui CaoXueshen WangZegang NiQina HanMingyu ZhangQing Zhong
Published in: IEEE Access (2021)
Keyphrases
  • noise level
  • image noise
  • noisy data
  • random noise
  • high speed
  • signal to noise ratio
  • additive noise
  • missing data
  • high density
  • noise model
  • analog vlsi
  • low cost
  • image quality
  • gaussian noise