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Dark current and noise of 100nm thick silicon on sapphire CMOS lateral PIN photodiodes.
Miriam Adlerstein Marwick
Francisco Tejada
Philippe O. Pouliquen
Eugenio Culurciello
Kim Strohbehn
Andreas G. Andreou
Published in:
ISCAS (2006)
Keyphrases
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cmos technology
high speed
silicon on insulator
low voltage
low cost
low power
transmission electron microscopy
metal oxide semiconductor
missing data
power consumption
noise model
random noise
neural network
noisy data
noise reduction
data sets
image noise
x ray
image processing
analog vlsi