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R(f)L(f)C coupled noise evaluation of an S/390 microprocessor chip.
Howard H. Smith
Aline Deutsch
Sharad Mehrotra
David Widiger
Michael A. Bowen
Allan H. Dansky
Gerard V. Kopcsay
Byron Krauter
Published in:
CICC (2001)
Keyphrases
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noisy data
high speed
physical design
low cost
evaluation model
circuit design
functional verification
ibm power processor
image processing
signal to noise ratio
evaluation metrics
analog vlsi