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Variation of I-V characteristics due to process parameters as base for modeling the component variability for LDD MOSFET devices.
Roberto Marani
Anna Gina Perri
Published in:
Int. J. Model. Simul. Sci. Comput. (2018)
Keyphrases
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computer vision
input parameters
data sets
maximum likelihood
database
real time
artificial intelligence
social networks
website
mobile devices
parameter space
parameter values
metamodel
modeling language
parameter adjustment