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Application of machine learning methods in post-silicon yield improvement.

Baris YigitGrace Li ZhangBing LiYiyu ShiUlf Schlichtmann
Published in: SoCC (2017)
Keyphrases
  • application of machine learning methods
  • low cost
  • machine learning
  • high speed
  • computer vision
  • real time
  • database systems
  • artificial neural networks
  • high density