Modeling of thermal field of substrate of integrated circuits by similarity method.
Ani G. HarutyunyanPublished in: EWDTS (2017)
Keyphrases
- high accuracy
- experimental evaluation
- integrated circuit
- synthetic data
- similarity measure
- high precision
- detection method
- significant improvement
- clustering method
- preprocessing
- modeling method
- computational cost
- classification accuracy
- data sets
- pairwise
- similarity search
- distance metric
- objective function
- similarity metric