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Diagnosing Multiple Byzantine Open-Segment Defects Using Integer Linear Programming.

Chen-Yuan KaoChien-Hui LiaoCharles H.-P. Wen
Published in: J. Electron. Test. (2011)
Keyphrases
  • integer linear programming
  • column generation
  • linear inequalities
  • fault tolerant
  • bicriteria
  • special case
  • dynamic programming
  • upper bound
  • orders of magnitude
  • cutting plane
  • defect detection