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A Derivative-Based Fast Autofocus Method in Electron Microscopy.
M. E. Rudnaya
H. G. ter Morsche
J. M. L. Maubach
Robert Martinus Maria Mattheij
Published in:
J. Math. Imaging Vis. (2012)
Keyphrases
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dynamic programming
high accuracy
pairwise
cost function
computational cost
detection method
electron microscopy
gaussian function
three dimensional
similarity measure
significant improvement
feature selection
face recognition
fine grained
low energy