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Silicon-on-Insulator Technology Impacts on SRAM Testing.

R. Dean AdamsPhil Shephard III
Published in: VTS (2000)
Keyphrases
  • silicon on insulator
  • cmos technology
  • low power
  • cost effective
  • power consumption
  • dynamic random access memory
  • low cost
  • parallel processing
  • low complexity
  • data transmission
  • power management
  • low voltage