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Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale.
Sören Hommel
Nicole Killat
A. Altes
Thomas Schweinböck
Doris Schmitt-Landsiedel
M. Silvestri
Oliver Haeberlen
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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image analysis
data analysis
scale space
machine learning
high throughput
learning algorithm
computer vision
information systems
website
multiscale
low cost
medical images