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Parametric yield maximization using gate sizing based on efficient statistical power and delay gradient computation.

Kaviraj ChopraSaumil ShahAshish SrivastavaDavid T. BlaauwDennis Sylvester
Published in: ICCAD (2005)
Keyphrases
  • statistical power
  • statistically significant
  • statistical significance
  • type i error
  • high quality
  • objective function
  • image analysis
  • high resolution
  • sample size