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Dynamic thermal modelling of a power integrated circuit with the application of structure functions.

Marcin JanickiJedrzej BanaszczykGilbert De MeyMarek KaminskiBjorn VermeerschAndrzej Napieralski
Published in: Microelectron. J. (2009)
Keyphrases
  • integrated circuit
  • multi view
  • dynamic environments
  • linear combination of basis
  • real time
  • data sets
  • general purpose
  • electron beam