Stochastic Testing Method for Transistor-Level Uncertainty Quantification Based on Generalized Polynomial Chaos.
Zheng ZhangTarek A. El-MoselhyIbrahim M. ElfadelLuca DanielPublished in: CoRR (2014)
Keyphrases
- high precision
- preprocessing
- high speed
- significant improvement
- computational complexity
- support vector machine
- cost function
- clustering method
- high accuracy
- probabilistic model
- experimental evaluation
- dynamic programming
- objective function
- data sets
- quantitative evaluation
- segmentation method
- test data
- high order
- error rate
- classification accuracy
- training set
- support vector
- training data
- similarity measure