Login / Signup
Conditionally robust two-pattern tests and CMOS design for testability.
Sunil D. Sherlekar
P. S. Subramanian
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1988)
Keyphrases
</>
design process
engineering design
low cost
knowledge based systems
power consumption
circuit design
data sets
neural network
case study
video sequences
design principles
design decisions
robust estimation