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Improving Performance under Process and Voltage Variations in Near-Threshold Computing Using 3D ICs.

Sandeep Kumar SamalGuoqing ChenSung Kyu Lim
Published in: ACM J. Emerg. Technol. Comput. Syst. (2017)
Keyphrases
  • real world
  • process model
  • database
  • genetic algorithm
  • computer vision
  • data structure
  • artificial neural networks