Guest Editors' Introduction: Selected Papers from IEEE VLSI Test Symposium.
Peter MarwedelTulika MitraMartin Edin GrimhedenHugo A. AndradePublished in: IEEE Des. Test (2020)
Keyphrases
- selected papers
- annual conference
- computer science
- invited talk
- international workshop
- conference proceedings
- information systems
- machine learning
- signal processing
- special issue
- neural network
- program committee
- vlsi design
- test cases
- artificial intelligence
- databases and information systems
- dagstuhl castle
- real time
- review process
- context aware
- high speed
- data sets