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On the evaluation of process-fault tolerance ability of CMOS integrated circuits.

Etienne SicardKozo Kinoshita
Published in: ITC (1990)
Keyphrases
  • fault tolerance
  • integrated circuit
  • fault tolerant
  • distributed systems
  • low cost
  • load balancing
  • high availability
  • replicated databases
  • distributed computing
  • database
  • peer to peer
  • low power