Detecting delay faults using power supply transient signal analysis.
Abhishek SinghChintan PatelShirong LiaoJames F. PlusquellicAnne E. GattikerPublished in: ITC (2001)
Keyphrases
- power supply
- signal analysis
- signal processing
- multiresolution
- intelligent control
- empirical mode decomposition
- feature extraction
- high frequency
- adaptive learning
- wavelet decomposition
- wavelet transform
- fault diagnosis
- rbf neural network
- computer vision
- subband
- lifting scheme
- median filter
- non stationary
- image data
- pattern recognition
- clustering algorithm
- image processing
- feature selection