Login / Signup

A surface potential model for predicting substrate noise coupling in integrated circuits.

Simon KristianssonFredrik IngvarsonShiva Prasad KaggantiKjell O. Jeppson
Published in: CICC (2004)
Keyphrases
  • integrated circuit
  • probabilistic model
  • computational model
  • management system
  • high level
  • d objects
  • mathematical model
  • hidden markov models
  • image restoration
  • statistical model
  • experimental data
  • noise level