Sensitivity-based investigation of threshold voltage variability in 32-nm flash memory cells.
Valentina BonfiglioGiuseppe IannacconePublished in: ESSDERC (2012)
Keyphrases
- flash memory
- metal oxide
- solid state
- random access
- disk drives
- garbage collection
- buffer management
- file system
- embedded systems
- main memory
- b tree
- database systems
- data storage
- small size
- hand held devices
- storage devices
- power system
- query processing
- real time
- database
- database management systems
- data structure
- low voltage