Small Defect Detection Using Convolutional Neural Network Features and Random Forests.
Xinghui DongChris J. TaylorTim F. CootesPublished in: ECCV Workshops (4) (2018)
Keyphrases
- random forests
- convolutional neural network
- defect detection
- random forest
- decision trees
- feature extraction
- steerable filters
- ensemble methods
- machine learning algorithms
- small number
- logistic regression
- feature set
- svm classifier
- k nearest neighbor
- head pose estimation
- text mining
- tree ensembles
- decision tree ensembles