A Probabilistic Approach to Diagnose SETs in Sequential Circuits.

Sreenivas Gangadhar Spyros Tragoudas

Published in: J. Electron. Test. (2013)

Keyphrases

probabilistic model
high speed
fault diagnosis
bayesian networks
probabilistic logic
decision trees
generative model
information theoretic
uncertain data
model based diagnosis
set theoretic
analog circuits
asynchronous circuits