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Exploratory Power Noise Models of Standard Cell 14, 10, and 7 nm FinFET ICs.
Ravi Patel
Kan Xu
Eby G. Friedman
Praveen Raghavan
Published in:
ACM Great Lakes Symposium on VLSI (2016)
Keyphrases
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case study
computational models
real time
training data
probabilistic model
low cost
statistical models
signal to noise ratio
random noise