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An Auto Chip Package Surface Defect Detection Based on Deep Learning.
Yuan Cao
Yubin Ni
You Zhou
Haotian Li
Zhao Huang
Enyi Yao
Published in:
IEEE Trans. Instrum. Meas. (2024)
Keyphrases
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deep learning
defect detection
textured surfaces
unsupervised feature learning
unsupervised learning
machine learning
feature extraction
d objects
restricted boltzmann machine
viewpoint
mental models
deep architectures
weakly supervised
pattern recognition
multiscale
three dimensional
image segmentation