Gate Oxide Short Defect Model in FinFETs.

Roya Dibaj Dhamin Al-Khalili Maitham Shams

Published in: J. Electron. Test. (2018)

Keyphrases

cost function
theoretical analysis
management system
computational model
prior knowledge
probabilistic model
mathematical model
statistical model
case study
three dimensional
high level
low cost
em algorithm
theoretical framework
experimental data
neural network model