Vision-Inspection-Synchronized Dual Optical Coherence Tomography for High-Resolution Real-Time Multidimensional Defect Tracking in Optical Thin Film Industry.
Deokmin JeonUnsang JungKibeom ParkPilun KimSangyeob HanHyosang JeongRuchire Eranga WijesingheNaresh Kumar RavichandranJaeyul LeeYoungmin HanMansik JeonJeehyun KimPublished in: IEEE Access (2020)
Keyphrases
- real time
- thin film
- optical coherence tomography
- high resolution
- white light interferometry
- vision system
- high density
- oct images
- low resolution
- spectral domain
- image processing
- multi layer
- short circuit
- solar cell
- super resolution
- imaging modalities
- computer vision
- field of view
- retinal images
- particle filter
- liquid crystal displays
- beating heart
- motion artifacts
- higher resolution
- decision making
- motion estimation
- remote sensing