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Simulation-Based Automatic Generation of Signomial and Posynomial Performance Models for Analog Integrated Circuit Sizing.
Walter Daems
Georges G. E. Gielen
Willy M. C. Sansen
Published in:
ICCAD (2001)
Keyphrases
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integrated circuit
data sets
experimental data
probabilistic model
prior knowledge
signal processing
image restoration
statistical model
digital circuits