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A study to detect a material deposition status in fused deposition modeling technology.
Chiyen Kim
David Espalin
Alejandro Cuaron
Mireya A. Perez
Eric MacDonald
Ryan B. Wicker
Published in:
AIM (2015)
Keyphrases
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thin film
data processing
empirical studies
theoretical framework
rapid development
key technologies
key findings
neural network
e learning
detection algorithm
current status
mathematical modeling
technology adoption