A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs.
Luca SterponeLudovica BozzoliCorrado De SioBoyang DuSarah AzimiPublished in: SMACD (2019)
Keyphrases
- high accuracy
- experimental evaluation
- synthetic data
- objective function
- fully automatic
- high precision
- cost function
- dynamic programming
- probabilistic model
- detection method
- statistical analysis
- learning algorithm
- data sets
- preprocessing
- recognition algorithm
- detection algorithm
- x ray
- medical images
- knn
- classification accuracy
- multiscale