Ultra-fast CV methods (< 10µs) for interface trap spectroscopy and BTI reliability characterization using MOS capacitors.
Tadeu Mota FrutuosoXavier GarrosJose Lugo-AlvarezRoméo Kom KammeugneL. D. M. ZouknakAbygaël VieyW. van den DaelePhilippe FerrariFred GaillardPublished in: IRPS (2022)