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Power-Constrained Testing of VLSI Circuits. Nikola Nikolici, Bashir M. Al-Hashimi. Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 178, plus XI, ISBN 1-4020-7235-X.
Mile K. Stojcev
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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vlsi circuits
low power
power consumption
power dissipation
third party
digital images
image processing
low cost
test cases
power management