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Test cost reduction for SOCs using virtual TAMs and lagrange multipliers.

Anuja SehgalVikram IyengarMark D. KrasniewskiKrishnendu Chakrabarty
Published in: DAC (2003)
Keyphrases
  • cost reduction
  • lagrange multipliers
  • constrained optimization
  • cost savings
  • machine learning
  • linear program
  • learning algorithm
  • evolutionary algorithm
  • rate distortion
  • lot size
  • lagrange multiplier method