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Numerical Device Simulation Aided Study of RF-Stress-Caused Degradation in SiGe HBTs.
Christoph Weimer
Viktor Kazantsev
Markus Mäller
Michael Schröter
Published in:
BCICTS (2023)
Keyphrases
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simulation study
neural network
real time
statistical analysis
experimental study
theoretical framework
simulation environment
mathematical analysis
database
reinforcement learning
information technology
mathematical model
qualitative and quantitative
numerical data