Maximum likelihood estimation of object location in diffraction tomography. II. Strongly scattering objects.
George A. TsihrintzisAnthony J. DevaneyPublished in: IEEE Trans. Signal Process. (1991)
Keyphrases
- object location
- maximum likelihood estimation
- density function
- electron microscope
- em algorithm
- mean shift
- moving objects
- object class
- object tracking
- maximum likelihood
- parameter estimation
- density estimation
- expectation maximization
- signal processing
- machine learning
- probability density function
- three dimensional
- mixture model
- image reconstruction
- bayesian framework
- object detection
- state space
- probability distribution
- object appearance
- optical flow