Designing the rule classification with oversampling approach with high accuracy for imbalanced data in semiconductor production lines.
Hsiao-Yu WangChenKun TsungChing-Hua HungChen-Huei ChenPublished in: Multim. Tools Appl. (2022)
Keyphrases
- imbalanced data
- production line
- class imbalance
- minority class
- imbalanced data sets
- majority class
- classification models
- support vector machine
- imbalanced datasets
- feature selection
- class distribution
- classification accuracy
- svm classifier
- support vector machine svm
- classification rules
- linear regression
- multistage
- feature extraction
- text classification
- nearest neighbour
- sampling methods
- classification algorithm
- feature space
- multi class
- decision boundary
- ensemble methods
- production system
- supervised learning
- active learning
- feature vectors
- buffer allocation
- test data
- classification error
- generalization ability
- machine learning methods
- data sets
- decision rules
- training samples
- image classification
- training set
- machine learning