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Configurable two-dimensional linear feedback shifter registers for parallel and serial built-in self-test.
Chien-In Henry Chen
Kiran George
Published in:
IEEE Trans. Instrum. Meas. (2004)
Keyphrases
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three dimensional
parallel processing
data sets
transfer function
parallel implementation
built in self test
database
shared memory
multi dimensional
real world
closed form
integrated circuit
website
graphics processing units
linear complexity
parallel hardware
real time